Cation profiling of passive films on stainless steel bydeconvolution of angle-resolved X-ray photoelectronspectroscopy data
(English)Manuscript (preprint) (Other academic)
A novel way of deconvoluting angle-resolved x-ray photoelectron spectroscopy (ARXPS) data to determine cation depth profiles in oxide films on stainless steels for a ternarysystem is presented. The passive films investigated were formed on AISI 316L EN 1.4432 stainless steel at the open circuit potential (OCP) in deionized water and at potentialsfrom −1.5 to +1.5V vs. Ag/AgCl in two acidic electrolytes: 0.5m H2SO4 and acetic acidcontaining 0.02m Na2B4O7 · 10H2O and 1m H2O. The passive films were about 1–2nmthick and contained concentration gradients of iron, chromium and molybdenum. Ironwas found to be present on the surface, chromium was mainly enriched in the middle, andmolybdenum was only present and strongly enriched in the inner region of the passivefilm. The ability to determine cation profiles in nanometer-thin oxide films provides newpossibilities for tailoring the properties of passive films on stainless steels.
passive film, molybdenum, stainless steel, gradients, ARXPS
Research subject Chemistry with specialization in Materials Chemistry
IdentifiersURN: urn:nbn:se:uu:diva-179397OAI: oai:DiVA.org:uu-179397DiVA: diva2:544490