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Phase formation and film morphology of ultrathin Co1-xNixSi2 films
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, Kina.
State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, Kina.
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2012 (English)In: Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films, ISSN 0734-2101, E-ISSN 1520-8559, Vol. 30, no 5, 050602- p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2012. Vol. 30, no 5, 050602- p.
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Electrical Engineering, Electronic Engineering, Information Engineering
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Engineering Science with specialization in Electronics
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URN: urn:nbn:se:uu:diva-180111DOI: 10.1116/1.4732736ISI: 000308404900002OAI: oai:DiVA.org:uu-180111DiVA: diva2:548164
Available from: 2012-08-29 Created: 2012-08-29 Last updated: 2017-12-07Bibliographically approved

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Gao, XindongZhang, Zhi-BinZhang, Shi-Li

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Journal of Vacuum Science & Technology. A. Vacuum, Surfaces, and Films
Electrical Engineering, Electronic Engineering, Information Engineering

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