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Temperature dependent electron beam induced current experiments on chalcopyrite thin film solar cells
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. Department of Engineering Sciences, Electronics. Fasta tillståndets elektronik.
1997 (English)In: APPLIED PHYSICS LETTERS, ISSN 0003-6951, Vol. 70, no 8, 1011-1013 p.Article in journal (Refereed) Published
Abstract [en]

Electron-beam-induced current (EBIC) profiles of Mo/CuInX(2)/CdS/ZnO thin film solar cells with X=Se, S were recorded at different temperatures. We measure the collection efficiency of cells as a function of the beam energy and subsequently identify the d

Place, publisher, year, edition, pages
1997. Vol. 70, no 8, 1011-1013 p.
Keyword [en]
INDUCED-CURRENT PROFILES; CELLS
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:uu:diva-27637OAI: oai:DiVA.org:uu-27637DiVA: diva2:55533
Note
Addresses: Scheer R, HAHN MEITNER INST BERLIN GMBH, ALTEILUNG GRENZFLACHEN, GLIENICKER STR 100, D-14109 BERLIN, GERMANY. UNIV UPPSALA, TEKNIKUM, S-75121 UPPSALA, SWEDEN.Available from: 2007-03-05 Created: 2007-03-05 Last updated: 2011-01-15

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Stolt, Lars

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