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Surface roughness characterisation of a thin transparent dielectric-silver tandem by spectroscopic light scattering
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
1998 (English)In: SOLAR ENERGY MATERIALS AND SOLAR CELLS, ISSN 0927-0248, Vol. 52, no 1-2, 37-43 p.Article in journal (Refereed) Published
Abstract [en]

Spectroscopic light scattering was measured on a system of a dielectric layer on top of a thin (13 nm) silver film on a glass substrate. The analysis included both forward and backward scattering and excellent agreement between measured and modelled resul

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 1998. Vol. 52, no 1-2, 37-43 p.
Keyword [en]
roughness; dielectric-silver tandem; spectroscopic light scattering; MULTILAYER; FILMS
Identifiers
URN: urn:nbn:se:uu:diva-28749OAI: oai:DiVA.org:uu-28749DiVA: diva2:56645
Note
Addresses: Roos A, Univ Uppsala, Dept Mat Sci, Box 534, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Mat Sci, S-75121 Uppsala, Sweden. TiNOX GmbH, D-80797 Munchen, Germany.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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