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Piezoelectric shear force detection: A geometry avoiding critical tip tuning fork gluing
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1998 (English)In: REVIEW OF SCIENTIFIC INSTRUMENTS, ISSN 0034-6748, Vol. 69, no 4, 1744-1746 p.Article in journal (Other scientific) Published
Abstract [en]

A technique for controlling the tip-sample distance in near-field optical microscopes is presented. It consists of mechanically exciting a fiber tip inserted without any adhesive between the two prongs of a high Q-piezoelectric tuning fork. The detection

Place, publisher, year, edition, pages
AMER INST PHYSICS , 1998. Vol. 69, no 4, 1744-1746 p.
Keyword [en]
SCANNING OPTICAL MICROSCOPY; SAMPLE DISTANCE CONTROL
Identifiers
URN: urn:nbn:se:uu:diva-28750OAI: oai:DiVA.org:uu-28750DiVA: diva2:56646
Note
Addresses: Salvi J, Univ Franche Comte, Fac Sci & Tech, Lab Opt PM Duffieux, CNRS, UMR 6603, FR 0067, F-25030 Besancon, France. Univ Franche Comte, Fac Sci & Tech, Lab Opt PM Duffieux, CNRS, UMR 6603, F-25030 Besancon, France. Univ Uppsala, Dept Mat Sci,Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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