A site-specific focused-ion-beam lift-out method for cryo Transmission Electron Microscopy
2012 (English)In: Journal of Structural Biology, ISSN 1047-8477, E-ISSN 1095-8657, Vol. 180, no 3, 572-576 p.Article in journal (Refereed) Published
The focused-ion-beam (FIB) is the method of choice for site-specific sample preparation for Transmission Electron Microscopy (TEM) in material sciences. A lamella can be physically lifted out from a specific region of a bulk specimen with submicrometer precision and thinned to electron transparency for high-resolution imaging in the TEM. The possibility to use this tool in life sciences applications has been limited by the lack of lift-out capabilities at the cryogenic temperatures often needed for biological samples. Conventional cryo-TEM sample preparation is mostly based on ultramicrotomy, a procedure that is not site-specific and known to produce artifacts. Here we demonstrate how a cooled nanomanipulator and a custom-built transfer station can be used to achieve cryo-preparation of TEM samples with the FIB, enabling high-resolution investigation of frozen-hydrated specimens in the TEM.
Place, publisher, year, edition, pages
2012. Vol. 180, no 3, 572-576 p.
Cryo-EM, Cryo-FIB, Cryo-SEM, Cryo-TEM, FIB, Frozen-hydrated sample, Sample preparation, Specimen thinning, TEM
Natural Sciences Engineering and Technology
Research subject Engineering Science with specialization in Materials Science
IdentifiersURN: urn:nbn:se:uu:diva-184896DOI: 10.1016/j.jsb.2012.08.012ISI: 000311471000020OAI: oai:DiVA.org:uu-184896DiVA: diva2:570911
De två första författarna delar förstaförfattarskapet.2012-11-202012-11-152014-04-29Bibliographically approved