X-ray Spectroscopic Study of Cu2S, CuS, and Copper Films Exposed to Na2S Solutions
2012 (English)In: The Journal of Physical Chemistry C, ISSN 1932-7447, E-ISSN 1932-7455, Vol. 116, no 42, 22293-22300 p.Article in journal (Refereed) Published
The electronic structure of copper sulfides was studied using X-ray absorption at Cu K and L-2,L-3 and S L-2,L-3 edges and X-ray emission spectroscopy at S L-2,L-3 thresholds. The experimental data were compared with results of local density approximation calculations taking into account the calculated valence band contributions and core-level chemical shifts between inequivalent sites. The presence of divalent Cu was detected in CuS with X-ray absorption spectroscopy in the high-energy-resolution fluorescence detection (HERFD) mode. The S L-2,L-3 emission spectrum of CuS was found to be significantly broader than that of Cu2S due to contributions from inequivalent S sites. This difference in the spectral width was used to distinguish between sulfide species formed on the Cu foil exposed to Na2S solutions. The Cu-S interaction processes for Cu films of different thicknesses exposed to Na2S solutions were monitored in situ using X-ray absorption spectroscopy in the HERFD mode at the Cu K edge. It was found that Cu ions were diffusing in the sulfide and entering the solution. The rate at which Cu ions enter the solution via diffusion was estimated on the basis of the results for a 1000 angstrom thick film.
Place, publisher, year, edition, pages
2012. Vol. 116, no 42, 22293-22300 p.
IdentifiersURN: urn:nbn:se:uu:diva-185495DOI: 10.1021/jp302390cISI: 000310121000023OAI: oai:DiVA.org:uu-185495DiVA: diva2:572270