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Infrared reflectance spectroscopy for surface topographic analysis of reststrahlen materials
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
1995 (English)In: SPIE, 1995, Vol. 2253, 1042-49 p.Conference paper (Other scientific)
Place, publisher, year, edition, pages
1995. Vol. 2253, 1042-49 p.
URN: urn:nbn:se:uu:diva-29712OAI: oai:DiVA.org:uu-29712DiVA: diva2:57608
Available from: 2008-10-17 Created: 2008-10-17

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