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Erratum to "Surface roughness of oxidized copper films studied by atomic force microscopy and spectroscopic light scattering"
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
1998 (English)In: Thin Solid Films, Vol. 325, 92-98 p.Article in journal (Other scientific) Published
Place, publisher, year, edition, pages
1998. Vol. 325, 92-98 p.
URN: urn:nbn:se:uu:diva-30252OAI: oai:DiVA.org:uu-30252DiVA: diva2:58148
Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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