Temperature dependence of the electrical resistivity and electronic structure of amorphous Fe100-xZrx films and multilayers
2012 (English)In: Journal of Physics: Condensed Matter, ISSN 0953-8984, E-ISSN 1361-648X, Vol. 24, no 49, 495402- p.Article in journal (Refereed) Published
The electrical resistivity of amorphous Fe100-xZrx metal alloy films and multilayers has been investigated in a wide temperature and composition range. The overall behavior of the resistivity is consistent with bulk measurements, exhibiting prominent semiconductor-like changes at low temperatures. The transition from positive (metallic) to negative temperature coefficient of resistivity behavior is accompanied by minute changes in magnetoresistance and we can therefore rule out magnetic phase changes as being the cause for the observed changes in the resistivity. Using x-ray absorption and emission spectroscopies we are able to probe the unoccupied and occupied electronic densities of states. The corresponding spectra are found to significantly overlap, as expected for a metallic-like electronic structure and the absence of a band gap. Besides a broadening of the x-ray emission lines expected from an amorphous material, remarkably small differences are observed in the electronic structures when changing the amount of Zr. The resistivity data were modeled and agreement with the Mott variable range hopping model was found, indicating localized electronic states due the disordered structure of the Fe100-xZrx alloys.
Place, publisher, year, edition, pages
2012. Vol. 24, no 49, 495402- p.
IdentifiersURN: urn:nbn:se:uu:diva-189122DOI: 10.1088/0953-8984/24/49/495402ISI: 000311429600010OAI: oai:DiVA.org:uu-189122DiVA: diva2:582569