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Thickness Dependence of the Optical Properties of Sputter Deposited Ti Oxide Films
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. SOLID STATE PHYSICS.
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2000 (English)In: Thin Solid Films, Vol. 365, 119-125 p.Article in journal (Refereed) Published
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2000. Vol. 365, 119-125 p.
URN: urn:nbn:se:uu:diva-31060OAI: oai:DiVA.org:uu-31060DiVA: diva2:58956
Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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