What one can learn about clusters using the unique tools of x-ray photoelectron spectroscopy
2012 (English)In: Journal of Physics, Conference Series, ISSN 1742-6588, E-ISSN 1742-6596, Vol. 388, no 15, 152025- p.Article in journal, Meeting abstract (Refereed) Published
This presentation is intended to illustrate various types of collisional processes relevant for free clusters probed by x-ray photoelectron spectroscopy using our own examples ranging from free-electron-metal clusters, through half-metal and semiconductor clusters to dielectrics, the latter from van-der-Waals to ionic clusters.
Place, publisher, year, edition, pages
2012. Vol. 388, no 15, 152025- p.
Collisional process, Free clusters, Half metals, Ionic clusters, Semiconductor clusters, Photoelectrons, X ray photoelectron spectroscopy
IdentifiersURN: urn:nbn:se:uu:diva-193914DOI: 10.1088/1742-6596/388/15/152025OAI: oai:DiVA.org:uu-193914DiVA: diva2:604058
27th International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2011, 27 July 2011 through 2 August 2011, Belfast