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Percolation and Electronic Device Degradation
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
1995 (English)In: Proc.Intern.Workshop on Noise and Reliability of Semiconductor Devices, T.Uni.Brno.Press, 1995, 151- p.Conference paper (Other scientific)
Place, publisher, year, edition, pages
1995. 151- p.
URN: urn:nbn:se:uu:diva-32939OAI: oai:DiVA.org:uu-32939DiVA: diva2:60837
Available from: 2008-10-17 Created: 2008-10-17

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