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Biased percolation model for the analysis of electronic-device degradation
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
1997 (English)In: Proc. 21st International Conference on Microelectronics, MIEL '97, IEEE Publishing, New York, NY, USA , 1997, Vol. 2, 651-654 p.Conference paper, Published paper (Other scientific)
Place, publisher, year, edition, pages
IEEE Publishing, New York, NY, USA , 1997. Vol. 2, 651-654 p.
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URN: urn:nbn:se:uu:diva-32946OAI: oai:DiVA.org:uu-32946DiVA: diva2:60844
Available from: 2008-10-17 Created: 2008-10-17

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CiteExportLink to record
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