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Influence of incoherent superposition of light on ellipsometric coefficients
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1997 (English)In: Applied Optics, Vol. 36, no 1, 319-327 p.Article in journal (Refereed) Published
Abstract [en]

Reflections from the back surface of a transparent substrate influence the evaluation of optical constants of thin films from ellipsometric measurements. If the thickness of the substrate is large compared with the coherence length of the light, the relat

Place, publisher, year, edition, pages
1997. Vol. 36, no 1, 319-327 p.
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URN: urn:nbn:se:uu:diva-32951OAI: oai:DiVA.org:uu-32951DiVA: diva2:60849
Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-15

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