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On the relation between X-ray Photoelectron Spectroscopy and XAFS
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Molecular and condensed matter physics.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Molecular and condensed matter physics.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Molecular and condensed matter physics.
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2013 (English)In: 15th International Conference On X-Ray Absorption Fine Structure (XAFS15), 2013Conference paper, Published paper (Refereed)
Abstract [en]

XAFS and X-ray Photoelectron Spectroscopy (XPS) are element specific techniques used in a great variety of research fields. The near edge regime of XAFS provides information on the unoccupied electronic states of a system. For the detailed interpretation of the XAFS results, input from XPS is crucial. The combination of the two techniques is also the basis for the so called core-hole clock technique. One of the important aspects of photoelectron spectroscopy is its chemical sensitivity and that one can obtain detailed information about the composition of a sample. We have for a series of carbon based model molecules carefully investigated the relationship between core level photoelectron intensities and stoichiometry. We find strong EXAFS-like modulations of the core ionization cross sections as function of photon energy and that the intensities at high photon energies converge towards values that do not correspond to the stoichiometric ratios. The photoelectron intensities are dependent on the local molecular structure around the ionized atoms. These effects are well described by molecular calculations using multiple scattering theory and by considering the effects due to monopole shake-up and shake-off as well as to intramolecular inelastic scattering processes.

Place, publisher, year, edition, pages
2013.
Series
Journal of Physics Conference Series, ISSN 1742-6588 ; 430
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:uu:diva-206403DOI: 10.1088/1742-6596/430/1/012131ISI: 000320464300131OAI: oai:DiVA.org:uu-206403DiVA: diva2:644518
Conference
15th International Conference on X-Ray Absorption Fine Structure (XAFS), JUL 22-28, 2012, Beijing, Peoples Republic of China
Available from: 2013-08-30 Created: 2013-08-30 Last updated: 2013-08-30Bibliographically approved

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Martensson, NilsSoderström, JohanSvensson, Svante

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