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Neutron induced single-word multiple-bit upset in SRAM
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Neutron Research.
Interfaculty Units, The Svedberg Laboratory.
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1999 (English)In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE, ISSN 0018-9499, Vol. 46, no 6, 1427-1433 p.Article in journal (Other scientific) Published
Abstract [en]

The Single-word Multiple-bit Upset (SMU) frequency fbr nine commercial Static Random Access Memories (SRAM) have been evaluated at eight different neutron energies; 0; 11MeV, 14MeV, 22MeV, 35MeV, 45MeV, 75MeV, 96MeV, 160MeV. The SRAM types used at these e

Place, publisher, year, edition, pages
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC , 1999. Vol. 46, no 6, 1427-1433 p.
Keyword [en]
EVENT UPSETS; GROUND-LEVEL; STATIC RAMS; FLIGHT
Identifiers
URN: urn:nbn:se:uu:diva-36698OAI: oai:DiVA.org:uu-36698DiVA: diva2:64597
Note
Addresses: Johansson K, Ericsson Saab Avion AB, Electomagnet Technol Div, Linkoping, Sweden. Ericsson Saab Avion AB, Electomagnet Technol Div, Linkoping, Sweden. Uppsala Univ, Dept Neutron Res, Uppsala, Sweden. Uppsala Univ, Svedberg Lab, Uppsala, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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