Resonant inelastic X-ray scattering as a probe of optical scale excitations in strongly electron-correlated systems: quasi-localized view
2000 (English)In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ISSN 0368-2048, Vol. 110, no 1-3, 213-233 p.Article in journal (Refereed) Published
An application of resonant inelastic X-ray scattering technique for studying optical scale excitations in electron-correlated materials is discussed. Examples are given including data obtained for 3d transition metal, lanthanide, and actinide systems. In
Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2000. Vol. 110, no 1-3, 213-233 p.
resonant inelastic X-ray scattering; 3d transition metal; lanthanide and actinide compounds; elementary and charge-transfer excitations; Anderson impurity model calculations; TRANSITION-METAL COMPOUNDS; HOPPING-MATRIX-ELEMENTS; FLUORESCENCE SPECTROSCOPY;
IdentifiersURN: urn:nbn:se:uu:diva-36921OAI: oai:DiVA.org:uu-36921DiVA: diva2:64820
Addresses: Butorin SM, Univ Uppsala, Dept Phys, Box 530, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden.2008-10-172008-10-172011-01-14