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A comparative study of X-ray absorption spectroscopy at various synchrotron facilities and the effect of transverse source coherence
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Physics.
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2000 (English)In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ISSN 0368-2048, Vol. 113, no 1, 67-77 p.Article in journal (Refereed) Published
Abstract [en]

Core level X-ray Absorption Spectroscopy measurements have been performed at the L-3,L-2 edges of thin film Fe samples deposited on the (100) surface of Cu. Soft X-rays from five different beamlines have been used to measure spectra from identical samples

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2000. Vol. 113, no 1, 67-77 p.
Keyword [en]
FINE-STRUCTURE; MAGNETISM; FE; CO; DIFFRACTION; UNDULATOR; SPECKLE; NI
Identifiers
URN: urn:nbn:se:uu:diva-36934OAI: oai:DiVA.org:uu-36934DiVA: diva2:64833
Note
Addresses: Dunn JH, Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA. Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA. Univ Uppsala, Dept Phys,Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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