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Enhanced frictive, adhesive and attractive forces imaged at etch-pit edges on highly-oriented pyrolytic graphite by scanning force microscopy
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Nuclear and Particle Physics.
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2000 (English)In: NANOTECHNOLOGY, ISSN 0957-4484, Vol. 11, no 1, 37-43 p.Article in journal (Refereed) Published
Abstract [en]

Etch pit edges or walls, induced on the surface of highly-oriented pyrolytic graphite (HOPG) by oxidative etching at high temperature, comprise a potentially useful model for the active surface sites present on various carbon-based materials. We have stud

Place, publisher, year, edition, pages
IOP PUBLISHING LTD , 2000. Vol. 11, no 1, 37-43 p.
Keyword [en]
TUNNELING MICROSCOPY; CLUSTER-IMPACT; ATOMIC-SCALE; SURFACE; CARBON; DEPTH; BEAM; TIP
Identifiers
URN: urn:nbn:se:uu:diva-36983OAI: oai:DiVA.org:uu-36983DiVA: diva2:64882
Note
Addresses: Mechler A, JATE Univ, Dept Opt & Quantum Elect, Box 406, H-6701 Szeged, Hungary. JATE Univ, Dept Opt & Quantum Elect, H-6701 Szeged, Hungary. Univ Uppsala, Dept Radiat Sci, Div Ion Phys, S-75121 Uppsala, Sweden. Hungarian Acad Sci, Res Grp LaseAvailable from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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