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Surface EXAFS study of the p4g(2 x 2) reconstruction of C on Ni(100) and C on Ni films
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Physics.
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2000 (English)In: SURFACE SCIENCE, ISSN 0039-6028, Vol. 465, no 3, 187-197 Language: English p.Article in journal (Refereed) Published
Abstract [en]

We report temperature- and angular-dependent surface extended X-ray absorption fine structure spectroscopy (SEXAFS) measurements of the p4g(2 x 2)C/Ni(100) system. Both a Ni(100) single crystal and a 4 monolayer Ni film evaporated on a Cu(100) single crys

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2000. Vol. 465, no 3, 187-197 Language: English p.
Keyword [en]
carbon; extended X-ray absorption fine structure (EXAFS); nickel; surface relaxation and reconstruction; ADSORBATE-INDUCED RECONSTRUCTION; PHONON-DISPERSION; CARBON; DYNAMICS; OXYGEN; STATES; ATOMS; PHASE; LEED
Identifiers
URN: urn:nbn:se:uu:diva-37114OAI: oai:DiVA.org:uu-37114DiVA: diva2:65013
Note
Addresses: Wende H, Free Univ Berlin, Inst Expt Phys, Arnimallee 14, D-14195 Berlin, Germany. Free Univ Berlin, Inst Expt Phys, D-14195 Berlin, Germany. IIT, Dept Phys, New Delhi 110016, India. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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