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Influence of heavy ion irradiation damage on silicon charged particle detector calibration
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science.
2000 (English)In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, ISSN 0168-583X, Vol. 161, 297-301 Language: English p.Article in journal (Refereed) Published
Abstract [en]

The full analytical potential of heavy ion backscattering and elastic recoil detection analysis (ERDA) depends critically on establishing a reliable energy calibration. In order to make accurate measurements of thin film samples we have investigated the c

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2000. Vol. 161, 297-301 Language: English p.
Keyword [en]
Si charged particle detector; ToF-E ERDA; energy calibration; radiation damage; SURFACE-BARRIER DETECTORS; RECOIL SPECTROMETRY; MASS; DEPENDENCE
URN: urn:nbn:se:uu:diva-37120OAI: oai:DiVA.org:uu-37120DiVA: diva2:65019
Addresses: Zhang YW, Uppsala Univ, Angstrom Lab, Div Ion Phys, POB 534, SE-75121 Uppsala, Sweden. Uppsala Univ, Angstrom Lab, Div Ion Phys, SE-75121 Uppsala, Sweden. Lund Inst Technol, Dept Phys Nucl, SE-22100 Lund, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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