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Probing surface states of Cu/Ni thin films using x-ray absorption spectroscopy - art. no. 113401
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Physics.
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2001 (English)In: PHYSICAL REVIEW B, ISSN 0163-1829, Vol. 6311, no 11, 3401-+ p.Article in journal (Refereed) Published
Abstract [en]

Surface and interface properties of Cu thin films (1-4 monolayers) deposited on Ni(100) have been extracted by means of x-ray absorption spectroscopy and analyzed in combination with ab initio density-functional calculations. An unoccupied Cu surface stat

Place, publisher, year, edition, pages
2001. Vol. 6311, no 11, 3401-+ p.
Keyword [en]
INVERSE-PHOTOEMISSION; METAL; CU
Identifiers
URN: urn:nbn:se:uu:diva-37218OAI: oai:DiVA.org:uu-37218DiVA: diva2:65117
Note
Addresses: Karis O, Univ Paris 06, Chim Phys Lab, 11 Rue Curie, F-75231 Paris 05, France. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden. Univ Uppsala, Condensed Matter Theory Grp, S-75121 Uppsala, Sweden.Available from: 2006-11-08 Created: 2006-11-08 Last updated: 2011-01-14

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Karis, OMagnuson, MartinMartensson, NEriksson, OJohansson, B

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