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X-ray absorption study of Ce-Ti oxide films
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. SOLID STATE PHYSICS.
2001 (English)In: ELECTROCHIMICA ACTA, ISSN 0013-4686, Vol. 46, no 13-14, 2055-2058 p.Article in journal (Refereed) Published
Abstract [en]

X-ray absorption measurements at the Ce L-3 L-1 and Ti K-edges have been done to study local structure and electronic properties of CeO2-TiO2 thin films produced by reactive d.c. magnetron sputtering. The local environment around titanium and cerium ions

Place, publisher, year, edition, pages
PERGAMON-ELSEVIER SCIENCE LTD , 2001. Vol. 46, no 13-14, 2055-2058 p.
Keyword [en]
CeO2-TiO2 thin films; X-ray absorption spectroscopy; local structure; amorphous; LITHIUM; INTERCALATION
Identifiers
URN: urn:nbn:se:uu:diva-37510OAI: oai:DiVA.org:uu-37510DiVA: diva2:65409
Note
Addresses: Purans J, Latvian State Univ, Inst Solid State Phys, Kengaraga St 8, LV-063 Riga, Latvia. Latvian State Univ, Inst Solid State Phys, LV-063 Riga, Latvia. Uppsala Univ, Angstrom Lab, Dept Mat Sci, SE-75121 Uppsala, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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