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A simple probe card for testing bumped fine pitch devices
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. MATERIALS SCIENCE/MST.
2000 (English)In: 37th IMAS Nordic Annual Conf., Helsingör, Denmark, 2000Conference paper (Other scientific)
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URN: urn:nbn:se:uu:diva-39723OAI: oai:DiVA.org:uu-39723DiVA: diva2:67623
Available from: 2008-10-17 Created: 2008-10-17

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