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Improved coherence measurements using voltage and transimpedance amplifiers in low-frequency noise characterisation of bipolar transistors
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. SIGNALS AND SYSTEMS.
2000 (English)In: IEEE Transactions on Electronic Devices, Vol. 47, 1772-1773 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2000. Vol. 47, 1772-1773 p.
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URN: urn:nbn:se:uu:diva-39899OAI: oai:DiVA.org:uu-39899DiVA: diva2:67799
Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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CiteExportLink to record
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