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Measurement of low-frequency base and collector current noise and coherence in SiGe heterojunction bipolar transistors using transimpedance amplifiers
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Technology, Department of Materials Science. SIGNALS AND SYSTEMS.
1999 (English)In: IEEE Transactions on Electronic Devices, Vol. 46, 993-1000 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1999. Vol. 46, 993-1000 p.
URN: urn:nbn:se:uu:diva-39903OAI: oai:DiVA.org:uu-39903DiVA: diva2:67803
Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

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