Variation of Schottky barrier height induced by dopant segregation monitored by contact resistivity measurements
2013 (English)Conference paper, Poster (Other academic)
Place, publisher, year, edition, pages
Electrical Engineering, Electronic Engineering, Information Engineering
Research subject Engineering Science with specialization in Electronics
IdentifiersURN: urn:nbn:se:uu:diva-213587OAI: oai:DiVA.org:uu-213587DiVA: diva2:682662
17th European Workshop on Materials for Advanced Metallization 2013 (MAM’2013), Leuven, Belgium, March 11-13, 2013.