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A Capacitance-Voltage Measurement Method for DMOS Transistor Channel Length Extraction
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
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1999 (English)In: Proc. of IEEE ICMTS, 1999, 135-140 p.Conference paper, Published paper (Refereed)
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1999. 135-140 p.
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Other Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:uu:diva-40403OAI: oai:DiVA.org:uu-40403DiVA: diva2:68304
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IEEE ICMTS'99
Available from: 2007-02-28 Created: 2007-02-28 Last updated: 2010-05-11Bibliographically approved

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Olsson, JörgenVestling, LarsNorde, Herman

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