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Ultra-thin poly-crystalline TiN films grown by HiPIMS on MgO(100) - In-situ resistance study of the initial stage of growth
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Materials Physics.
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2013 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 549, 199-203 p.Article in journal, Meeting abstract (Refereed) Published
Abstract [en]

The growth of ultra-thin TiN films on single-crystalline MgO(100) substrates by high power impulse magnetron sputtering (HiPIMS) was studied for growth temperatures ranging from 35 degrees C to 600 degrees C. X-ray analysis showed that the films had a textured poly-crystalline structure. Films grown by dc magnetron sputtering (dcMS) were epitaxial at the higher growth temperatures. In-situ resistance measurements, during growth, revealed the coalescence thickness and film continuity thickness. The film grown by HiPIMS at room temperature coalesced at 1.2 +/- 0.1 nm and became structurally continuous at 2.67 +/- 0.15 nm. At 600 degrees C, the coalescence and continuity thicknesses decreased to 0.56 +/- 0.05 nm and 0.82 +/- 0.05 nm, respectively. X-ray reflectivity measurements revealed that the growth rate of the films was roughly constant for all growth temperatures. The film density increased slightly with growth temperature up to 5.3 g/cm(3) at 600 degrees C and the surface roughness of the films decreased from 1 nm to 0.3 nm while the growth temperature increased from 35 degrees C to 600 degrees C. Grazing incident X-ray diffraction measurements showed the presence of [111], [200] and [220] crystallites at all growth temperatures. The smallest [200] and [220] grain sizes appeared at 100 degrees C while the [200] grain size increased by increasing the growth temperature.

Place, publisher, year, edition, pages
2013. Vol. 549, 199-203 p.
Keyword [en]
In-situ resistivity, Thin film, Titanium nitride, High power impulse magnetron sputtering
National Category
Natural Sciences
URN: urn:nbn:se:uu:diva-213449DOI: 10.1016/j.tsf.2013.07.074ISI: 000327537100036OAI: oai:DiVA.org:uu-213449DiVA: diva2:683540
The 40th International Conference on Metallurgical Coatings and Thin Films (ICMCTF 2013), April 29-May 3, 2013, San Diego, CA, USA
Available from: 2014-01-04 Created: 2013-12-23 Last updated: 2014-01-04Bibliographically approved

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