Deposition and characterization of NbxC60 films
2002 (English)In: Thin Solid Films, no 405, 42-49 p.Article in journal (Refereed) Published
NbxC60 films have been deposited at 100 °C by co-evaporation of Nb and C60 under ultrahigh vacuum conditions. In situ X-ray photoelectron spectroscopy analyses of films with a low Nb content showed peak shifts and changes in the C 1s shake-up satellites that are consistent with the formation of a niobium fulleride phase. Higher Nb contents (x>5.5) lead to a decomposition of C60 and the formation of NbC. The films were rather stable in air and could be analysed ex situ with different techniques. Analyses with Raman spectroscopy showed many additional lines, which were attributed a new fulleride phase NbxC60 co-existing with unreacted C60. The amount of unreacted C60 in the films can be reduced by dissolving in toluene, but cannot be completely excluded. X-Ray diffraction analysis showed very poor crystallinity of the films; nevertheless, it is possible to attribute the diffraction patterns observed to a cubic structure with a slightly reduced cell parameter compared to C60. The NbxC60 shows similarities to previously reported polymeric PdxC60 and PtxC60.
Place, publisher, year, edition, pages
2002. no 405, 42-49 p.
IdentifiersURN: urn:nbn:se:uu:diva-42174DOI: doi:10.1016/S0040-6090(01)01726-6OAI: oai:DiVA.org:uu-42174DiVA: diva2:70075