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Surface-energy triggered phase formation and epitaxy in nanometer-thick Ni1−xPtx silicide films
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
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2010 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 96, 071915- p.Article in journal (Refereed) Published
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2010. Vol. 96, 071915- p.
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Engineering and Technology
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URN: urn:nbn:se:uu:diva-222462OAI: oai:DiVA.org:uu-222462DiVA: diva2:711664
Available from: 2014-04-10 Created: 2014-04-10 Last updated: 2017-12-05

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Zhen, ZhangZhang, Shi-Li

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