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Defect level signatures in CuInSe< sub> 2 by photocurrent and capacitance spectroscopy
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
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2013 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 535, 366-370 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2013. Vol. 535, 366-370 p.
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Condensed Matter Physics Engineering and Technology
Research subject
Engineering Science with specialization in Electronics
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URN: urn:nbn:se:uu:diva-222886OAI: oai:DiVA.org:uu-222886DiVA: diva2:712479
Available from: 2014-04-15 Created: 2014-04-15 Last updated: 2017-12-05

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Larsen, Jes K

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