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Small area detectors at the European XFEL
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2014 (English)In: Journal of Instrumentation, ISSN 1748-0221, Vol. 9, C05063- p.Article in journal (Refereed) Published
Abstract [en]

The detectors to be used at the European XFEL have to deal with the unique time structure of the machine, delivering up to 2700 pulses, with a repetition rate of 4.5 MHz, ten times per second, the very high photon flux and the need to combine single-photon sensitivity and a large dynamic range. This represents a challenge not only for the large-area 2D imaging detectors but also for the smaller-area detectors and makes the use of standard commercial devices impossible. Dedicated solutions are therefore envisaged for small imaging- or strip-detectors. In this contribution the focus is put on two particular small-area detector solutions which are planned to be used at the European XFEL, a strip detector for hard X-rays (with energy 3 < E < 25keV) and an imaging detector for soft X-rays (0.25 < E < 3keV). Hard X-rays photon-beam diagnostics as well as hard X-ray absorption and emission spectroscopy at the European XFEL make use of strip detectors as detectors for beam spectrometers or as energy-dispersive detectors in combination with an energy-dispersive element. The European XFEL is establishing cooperation with the Paul Scherrer Institute in Villigen to develop a new version of the Gotthard detector best suited to the European XFEL needs. The use case and the required detector specifications are illustrated. Starting from the present detector version, the modifications planned to adapt it to the European XFEL running conditions are described. These include the capability of running at an increased rate and to provide a veto signal to the large 2D imaging detectors, in order to be able to remove non-interesting images already at early stages of the DAQ system. In another particular application, resonant inelastic X-ray scattering, a Micro-Channel Plate detector matched to a delay-line readout is foreseen to be used. In this case the European XFEL is aiming for a highly customized solution provided by the German company Surface Concept. The use case is described, the science-driven detector specifications are illustrated and the expected detector performance is shown.

Place, publisher, year, edition, pages
2014. Vol. 9, C05063- p.
Keyword [en]
X-ray detectors, Spectrometers
National Category
Physical Sciences
URN: urn:nbn:se:uu:diva-231447DOI: 10.1088/1748-0221/9/05/C05063ISI: 000340036100063OAI: oai:DiVA.org:uu-231447DiVA: diva2:745221
Available from: 2014-09-10 Created: 2014-09-08 Last updated: 2014-09-10Bibliographically approved

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Nordgren, Joseph
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