Surface modification of iron oxides by ion bombardment – comparing depth profiling by HAXPES and Ar ion sputtering
(English)Manuscript (preprint) (Other academic)
Iron oxide in the form of maghemite γ-Fe2O3 and hematite α-Fe2O3 has been studied with x-ray photoelectron spectroscopy. It is found that even low energy sputtering induces a reduction of the surface layer into FeO. Satellites in the Fe 2p core level spectra are used to determine the oxidation state of iron. Depth profiling with changing photon energy shows that the unsputtered films are homogeneous and that the information obtained from sputtering thus, in this instance, represents sputter damages to the sample.
Hard X-ray Photoelectron Spectroscopy, Depth profiling, Iron oxide, HAXPES, synchrotron radiation
IdentifiersURN: urn:nbn:se:uu:diva-232947OAI: oai:DiVA.org:uu-232947DiVA: diva2:750278