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Stress and reliability of integrated RF-LDMOS transistors
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
2015 (English)In: CSTIC, 2015Conference paper, Oral presentation only (Refereed)
Place, publisher, year, edition, pages
2015.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Engineering Science with specialization in Electronics
Identifiers
URN: urn:nbn:se:uu:diva-247360OAI: oai:DiVA.org:uu-247360DiVA: diva2:796021
Conference
invited talk, CSTIC, Shanghai, March 15-16
Available from: 2015-03-17 Created: 2015-03-17 Last updated: 2015-07-02

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Olsson, Jörgen

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CiteExportLink to record
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