Detection of the Magnetocrystalline Anisotropy in X-Ray Magnetic Linear Dichroism Reflection Spectra Across the Fe 3p and 2p Edges
2014 (English)In: IEEE transactions on magnetics, ISSN 0018-9464, E-ISSN 1941-0069, Vol. 50, no 11, 2104704Article in journal (Refereed) Published
The magnetocrystalline anisotropy of X-ray magnetic linear dichroism (XMLD) reflection spectra measured on single-crystalline bcc Fe films across the 3p and 2p edges are presented. The XMLD spectra were obtained from a series of reflection spectra by aligning the electric field vector of linearly polarized undulator radiation with respect to the crystal axes. Our results show the presence of a huge magnetocrystalline anisotropy in the XMLD reflection spectra. The XMLD signal is further investigated as a function of the Fe film thickness in Au/Fe/Ag/GaAs layered systems. Simulations of the reflection spectra reveal the influences of interference effects, which can enhance or diminish the XMLD signals. The measured spectra are in good agreement with ab initio calculated spectra.
Place, publisher, year, edition, pages
2014. Vol. 50, no 11, 2104704
Ab initio theory, magnetooptics, synchrotron radiation, X-ray magnetic linear dichroism (XMLD)
Other Physics Topics
IdentifiersURN: urn:nbn:se:uu:diva-247457DOI: 10.1109/TMAG.2014.2321632ISI: 000349465900083OAI: oai:DiVA.org:uu-247457DiVA: diva2:796326