Nanoparticle characterization by means of scanning free grazing emission X-ray fluorescence.
2015 (English)In: Nanoscale, ISSN 2040-3364, E-ISSN 2040-3372, Vol. 7, no 20, 9320-9330 p.Article in journal (Refereed) Published
Nanoparticles are considered for applications in domains as various as medical and pharmaceutical sciences, opto- and microelectronics, catalysis, photovoltaics, spintronics or nano- and biotechnology. The applications realized with nanocrystals depend strongly on the physical dimensions (shape and size) and elemental constitution. We demonstrate here that grazing emission X-ray fluorescence (GEXRF) is an element sensitive technique that presents the potential for a reliable and accurate determination of the morphology of nanoparticles deposited on a flat substrate (ready-to-use devices). Thanks to the scanning-free approach of the used GEXRF setup, the composition, shape and average size of nanoparticles are determined in short time intervals, minimizing the exposure to radiation. The (scanning-free) GEXRF technique allows for in situ investigations of the nanoparticulate systems thanks to the penetration properties of both the probe X-ray beam and the emitted X-ray fluorescence signal.
Place, publisher, year, edition, pages
2015. Vol. 7, no 20, 9320-9330 p.
IdentifiersURN: urn:nbn:se:uu:diva-252489DOI: 10.1039/c5nr00791gISI: 000354456800026PubMedID: 25946258OAI: oai:DiVA.org:uu-252489DiVA: diva2:810905