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Measurement of drift velocity of electrons in silicon by exciting a diode structure with short superradiant laser pulses
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
1970 (English)In: IEEE Transactions on Electron Devices, ISSN 0018-9383, Vol. ED-17, no 5, 407- p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1970. Vol. ED-17, no 5, 407- p.
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Engineering and Technology
URN: urn:nbn:se:uu:diva-257753OAI: oai:DiVA.org:uu-257753DiVA: diva2:840419
Available from: 2015-07-08 Created: 2015-07-08 Last updated: 2015-07-08

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