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Measurement of the rectrifying barrier heights of various rhodium silicides with n-silicon
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1980 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 36Article in journal (Refereed) Published
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1980. Vol. 36
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Engineering and Technology
URN: urn:nbn:se:uu:diva-257870OAI: oai:DiVA.org:uu-257870DiVA: diva2:840757
Available from: 2015-07-09 Created: 2015-07-09 Last updated: 2015-07-09

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