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Laser scanning technique for the detection of resistivity inhomogeneities in silicon using liquid rectifying contacts
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
1980 (English)In: IEEE Transactions on Electron Devices, ISSN 0018-9383, E-ISSN 1557-9646, Vol. ED-27, no 11Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1980. Vol. ED-27, no 11
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Engineering and Technology
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URN: urn:nbn:se:uu:diva-257919OAI: oai:DiVA.org:uu-257919DiVA: diva2:840843
Available from: 2015-07-09 Created: 2015-07-09 Last updated: 2017-12-04

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