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A comparison between the diffusion model and the combined diffusion-thermionic-emission model for MS junctions by two-carrier numerical computations
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
1981 (English)In: Physica Scripta, ISSN 0031-8949, E-ISSN 1402-4896, Vol. 24, 456- p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1981. Vol. 24, 456- p.
National Category
Engineering and Technology
URN: urn:nbn:se:uu:diva-257932OAI: oai:DiVA.org:uu-257932DiVA: diva2:840861
Available from: 2015-07-09 Created: 2015-07-09 Last updated: 2015-07-09

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