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Multi-cathode influences on the internal excess-carrier distribution during the GTO turn-off process
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
1990 (English)Conference paper (Refereed)
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Engineering and Technology
URN: urn:nbn:se:uu:diva-258435OAI: oai:DiVA.org:uu-258435DiVA: diva2:841656
Nord Semiconductor Meeting, Århus, Danmark
Available from: 2015-07-14 Created: 2015-07-14 Last updated: 2015-07-14

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