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Evaluation of carrier lifetime in power semiconductors using both optical and electrical measurements supported by two-dimensional computer simulation
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1993 (English)In: Journal of Communications, Vol. XLIV, 14-22 p.Article in journal (Refereed) Published
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1993. Vol. XLIV, 14-22 p.
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Engineering and Technology
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URN: urn:nbn:se:uu:diva-258531OAI: oai:DiVA.org:uu-258531DiVA: diva2:841887
Available from: 2015-07-15 Created: 2015-07-15 Last updated: 2015-07-15

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CiteExportLink to record
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  • apa
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