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Measurements of failure phenomena ininductively loaded multi-cathode GTO thyristors
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1994 (English)In: IEEE Transactions on Electron Devices, ISSN 0018-9383, Vol. 41, no 2, 251-257 p.Article in journal (Refereed) Published
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1994. Vol. 41, no 2, 251-257 p.
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Engineering and Technology
URN: urn:nbn:se:uu:diva-258595OAI: oai:DiVA.org:uu-258595DiVA: diva2:841984
Available from: 2015-07-16 Created: 2015-07-16 Last updated: 2015-07-16

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