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A study of turn-off limitations and failur mechanisms in GTO thyristors by means of 2-D time-resolved optical measurements
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1992 (English)In: Solid-State Electronics, ISSN 0038-1101, E-ISSN 1879-2405, Vol. 35, no 11, 1683-1695 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1992. Vol. 35, no 11, 1683-1695 p.
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Engineering and Technology
URN: urn:nbn:se:uu:diva-258679OAI: oai:DiVA.org:uu-258679DiVA: diva2:842249
Available from: 2015-07-17 Created: 2015-07-17 Last updated: 2015-07-17

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