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Application of optically probed lifetime and diffusion-coefficient measurements on particle irradiated silicon under high-level injection conditions
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
1992 (English)Conference paper (Refereed)
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Engineering and Technology
URN: urn:nbn:se:uu:diva-258689OAI: oai:DiVA.org:uu-258689DiVA: diva2:842264
15th Nordic semiconductor meeting, Finland
Available from: 2015-07-17 Created: 2015-07-17 Last updated: 2015-07-17

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