uu.seUppsala University Publications
Change search
ReferencesLink to record
Permanent link

Direct link
Low-frequency noise and Coulomb scattering in Si0.8 Ge0.2 surface channel pMOSFET's with ALD Al2O3 gate dielectrics
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
Show others and affiliations
2005 (English)In: Solid-State Electronics, ISSN 0038-1101, E-ISSN 1879-2405, Vol. 49, 907-914 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2005. Vol. 49, 907-914 p.
National Category
Engineering and Technology
URN: urn:nbn:se:uu:diva-258887OAI: oai:DiVA.org:uu-258887DiVA: diva2:842583
Available from: 2015-07-21 Created: 2015-07-21 Last updated: 2015-07-21

Open Access in DiVA

No full text

By organisation
Solid State Electronics
In the same journal
Solid-State Electronics
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

Total: 383 hits
ReferencesLink to record
Permanent link

Direct link