Formation of the energetic doubly charged ne ion by irradiation of large neon clusters using intense EUV-FEL pulses at 52 nm
2010 (English)Conference paper (Refereed)Text
The interaction of clusters with intense EUV-FEL pulses was investigated using the SPring-8 Compact SASE Source (SCSS) test facility in Japan. Neon clusters of mean sizes <N> = 1000 and 4000 were irradiated by intense FEL pulses at 52 nm and emitted ions were detected by a momentum imaging spectrometer. The production of energetic doubly charged ions was not found for Ne 1000, but it was observed for Ne 4000 clusters, which suggests that an inhomogeneous charge distribution is generated for the larger clusters.
Place, publisher, year, edition, pages
Institute of Physics (IOP), 2010. Vol. 235, no 1, 012019- p.
, Journal of Physics: Conference Series, ISSN 1742-6588
Experimental/ atomic clusters, free electron lasers, imaging, ion emission, neon, positive ions, ultraviolet spectra/ energetic doubly charged Ne ion, neon cluster irradiation, intense EUV-FEL pulses, cluster interaction, sPring-8 compact SASE source test facility, SCSS, momentum imaging spectrometer, Ne1000 clusters, Ne4000 clusters, inhomogeneous charge distribution, self-amplified spontaneous-emission, wavelength 52 nm, Ne 1000, Ne 4000/ A3640 Atomic and molecular clusters A3220J Visible and ultraviolet atomic spectra A4255T Free electron lasers/ wavelength 5.2E-08 m/ Ne1000/el Ne/el, Ne4000/el Ne/el
IdentifiersURN: urn:nbn:se:uu:diva-279510DOI: 10.1088/1742-6596/235/1/012019ISI: 11456858OAI: oai:DiVA.org:uu-279510DiVA: diva2:908282
International Workshop on Electronic Spectroscopy for Gas-phase Molecules and Solid Surfaces (IWES 2009), 12-15 Oct. 2009, Matsushima, Japan