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High Resolution Photon Counting Detection System for Advanced Inelastic X-Ray Scattering Studies
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2006 (English)In: 2006 IEEE Nuclear Science Symposium Conference Record, 2006, Vol. 2, 735-739 p.Conference paper (Refereed)Text
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2006. Vol. 2, 735-739 p.
Keyword [en]
X-ray detection;X-ray scattering;photon counting;advanced inelastic X-Ray scattering;advanced light source;advanced photon counting detection system;advanced time resolved X-ray emission spectroscopy;angular resolved fluorescence measurement;delayed fluorescence;high resolution photon counting detection system;microchannel plates;soft X-ray spectroscopic study;synchrotron sources;time resolved fluorescence measurement;Delay;Face detection;Fluorescence;Probes;Spectroscopy;Synchrotrons;Timing;X-ray detection;X-ray detectors;X-ray scattering;Delayed fluorescence;High resolution photon counting;Time resolved event detection
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URN: urn:nbn:se:uu:diva-283250DOI: 10.1109/NSSMIC.2006.355959OAI: oai:DiVA.org:uu-283250DiVA: diva2:918848
2006 IEEE Nuclear Science Symposium Conference
Available from: 2016-04-12 Created: 2016-04-12 Last updated: 2016-04-12

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Söderström, Johan
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Molecular and condensed matter physics
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